Products :: Test & Measurement :: Wire & Cable Harness


Wiring Analyzers

Distributed Switching:

  • Model 2650.MTA - eliminate costly adapters by bringing switching unit to product

Model 2650.MTA

DIT-MCO Model 2650.MTA - Gains MIL-STD 810F certification.


Created by the U.S. government and approved for use by all departments and agencies of the Department of Defense, MIL-STD-810F test procedures measure a products reliability and performance in extreme environments.

What is a Modular Test Analyzer?

DIT-MCO’s newest test solution, the Model 2650, incorporates modularity so that the system conforms to your testing needs. The modular switching units can rack-and-stack in a cabinet providing concentrated test points or can be distributed around the Unit Under Test (UUT) eliminating long, cumbersome adapter cables. Or you may reconfigure the system at any time when your needs or the UUT changes.

Why utilize distributed switching?

In order to provide efficient test operations with large UUTs, moving the tester close to the product under test is optimal. The distributed configuration eliminates long, cumbersome adapter cables that are expensive to rework and difficult to store.

Two modules stacked on trolley for mobility. The switch modules can be placed randomly where needed, such as a cockpit or wing section, or can be stacked on a trolley for mobility and flexibility. In addition, you may want to mix racked modules with distributed modules. You make the choice that makes sense for your operation.

What are my configuration choices?

DIT-MCO’s Model 2650.MTA is our most flexible test system. You can utilize multiple test stations operating from a single controller reducing the total cost of testing. The individual switching modules interlock to allow stacking of the units for mobility and quick setup while maintaining secured positioning. Any switching configuration and test addresses is possible with the virtual test address control eliminating module or cabinet restrictions.

The 2650.MTA’s switching module supports up to 1500 test points per unit but can be configured to suit your needs in increments of 100 points so you won’t waste test electronics. Test interfaces on the standard unit are either 150 point ZIF or 50 pin D-sub connectors but can be customized to fit your needs. Special 500 point switching modules provide small size and weight for use in locations where only a few test points are required.

Other standard convenience features in the Model 2650.MTA include the external energization and test probe connections built into each switching module. This allows you to quickly access any point that requires power or testing with the probe.

If you require a large number of external energization points, special switching modules configured only with EE cards accommodate this need. Just place the EE modules as you would any other switching module.

How can I reduce hook-up times?

With the Model 2650’s optional random hookup feature, you don’t have to worry about cable connections to the tester. You simply start hooking up adapter cables in any order. A bar code or embedded ID identifies the cables and their locations. The test system automatically matches the cable hookup and runs your test program, as written without modifications. What could be simpler?

What about system maintenance?

Rear removable switching cards allow for easy maintenance without disturbing front interface cabling. Maintenance has also been simplified so your operators don’t have to unhook adapter cables to remove switching cards. With rear access to the switching, faster maintenance and repair means less downtime for your systems.